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Keyword [polycrystalline silicon (poly-Si) thin film transistors (TFTs)]
Result: 1 - 2 | Page: 1 of 1
1.
Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
2.
Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
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