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Keyword [pMOSFETs]
Result: 1 - 7 | Page: 1 of 1
1.
Superiority And Reliability Of MOSFETs With High Mobility Channel
2.
A New Measurement Method For Nano-cmos Devices And For The Reliability Study
3.
Eot Reduction Method For High-k Metal Gate Structure PMOSFETs At 14nm Nodes
4.
Impact Of The NiSi
1-x
Ge
x
Composition On The Electrical Properties Of Ge Channel Schottky-Barrier PMOSFETs
5.
Atomic-scale defects involved in the negative bias temperature instability in silicon dioxide and plasma-nitrided oxide based pMOSFETs
6.
Physical model enhancement and exploration of bandgap engineering in novel sub-100nm pMOSFETs
7.
Enhanced hot-hole degradation and negative bias temperature instability (NBTI) in p+-poly PMOSFETs with oxynitride gate dielectrics
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