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Keyword [oxide charges]
Result: 1 - 4 | Page: 1 of 1
1.
Study On NBTI Of Micro-Nano Meter PMOS Devices
2.
The Study Of Hot Carrier Injection Effect In Sub-Micron MOS Devices
3.
The Study Of Hot Carrier Injection Effect In Sub-micron Mos Devices
4.
Study On The Gate Leakage Current Of Uitra-thin MOS Devices
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