metal oxide semiconductor - Globe Thesis

Keyword [metal oxide semiconductor] Result: 121 - 140 \| Page: 7 of 8
121.	Novel silicon metal-oxide semiconductor devices for molecular sensing and hot electron spectroscopy
122.	Ultraviolet-assisted processing of dielectric thin-films for metal oxide semiconductor applications
123.	Characterization of high-kappa gate stacks in metal-oxide-semiconductor capacitors
124.	Design of advanced low-power, sub-quarter micron metal oxide semiconductor field effect transistors (MOSFET)
125.	Device design and fabrication of aluminum gallium nitride/gallium nitride metal-oxide-semiconductor heterostructure field-effect transistors
126.	Studies in remote plasma nitridation of silicon dioxide for metal-oxide-semiconductor gate dielectric applications
127.	A three-dimensional analytical model for small -geometry metal oxide semiconductor field effect transistor
128.	Design, characterization, and profile optimization of silicon-germanium complementary metal-oxide-semiconductor field effect transistors on silicon-on-sapphire (SOS)
129.	Valence-band electron tunneling in deep-submicron metal oxide semiconductor field-effect transistors
130.	Collinear acousto-optical interaction in proton-exchanged lithium niobate, and Submicron silicon-on-insulator metal-oxide-semiconductor field-effect-transistors
131.	Post-shrink Schottky-source metal-oxide-semiconductor field-effect transistors
132.	Investigation of direct tunnel gate oxides fabricated by rapid thermal processing for metal oxide semiconductor field effect transistor applications
133.	Applications of polycrystalline silicon-germanium thin films in metal-oxide-semiconductor technologies
134.	Low temperature measurement of silicon/silicon dioxide interface roughness and interface trapped charge in metal-oxide-semiconductor devices
135.	Bipolar complementary metal-oxide semiconductor operational amplifier design
136.	Structure analysis and modeling for a merged BIPMOS device
137.	THE OBTAINABLE ACCURACY OF ANALOG METAL OXIDE SEMICONDUCTOR INTEGRATED CIRCUIT ELEMENTS (MOS)
138.	A STUDY OF THE BULK AND INTERFACE DEFECTS IN SILICON METAL - OXIDE - SEMICONDUCTOR MICROSTRUCTURES
139.	Extraction of carrier mobility and interface trap density in InGaAs metal oxide semiconductor structures using gated Hall method
140.	Correlation of Electrical Defects and Device Performance for Wide Bandgap Metal-Oxide Semiconductor
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