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Keyword [leakage current density]
Result: 1 - 3 | Page: 1 of 1
1.
Study On The Electrical Properties Of Trench Barrier Schottky Diode
2.
Study On The Characteristics Of The La
3
O
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/SiO
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/4H-SiC MOS Capactiors
3.
Processing and characterization of high performance gate dielectric materials by rapid photothermal process based atomic layer deposition (ALD) system
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