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Keyword [interface states]
Result: 1 - 20 | Page: 1 of 2
1.
Study Of Hot-carrier Degradation Effects Of MOSFET
2.
Study On NBTI Of Micro-Nano Meter PMOS Devices
3.
Study On The Structure And Reliability Of Deep Submicrion SDE MOSFET
4.
A Study On SiO
2
/SiC Interface Characteristics
5.
The Study On 4H-SiC MOS Process And Electrical Properties
6.
Study On Hot-carrier Effect In Ultra-deep Submicronmeter MOSFET
7.
Electrical Properties Of SiO
2
/SiC Interface Treated By Nitrogen And Hydrogen Plasma
8.
Effect Of The Ion Implantation On 4H-SiC MOS Interface
9.
Study On The Feasibility Of SiC Based Light-controlled Devices
10.
Hydrogen Plasma Modification Study Of Metal/SiC Contact Interface
11.
Research On Interface Characteristics Of Strained Silicon MOS
12.
Metal Gate/high K Gate Dielectric Layer/ge Mos Capacitor
13.
Study On Leakage Current Mechanism And Frequency Dispersion Properties Of GaN-based Electronic Devices
14.
Study On The Preparation And Characteristics Of HfAlO/SiC MOS Structure
15.
Study On Photoelectric Properties Of TiO
2
Surface And Interface States By Surface Photovoltage Techniques
16.
Reseach On Current Model Induced By Total Dose Effects In NMOS Transistors
17.
Research On Interface Characterization Of GaN-based Metal-Oxide-Semiconductor Diode
18.
Research On The Correlation Between Charge Carriers Trapping Near The SiC-SiO
2
Interface And 1/f Noise In 4H-SiC MOSFETs
19.
Capacitance-voltage Characterization Technology Of Stacked Bonding Structure In 3D Integration
20.
First-principles Investigation On The Defects At SiC/SiO
2
Interface
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