Font Size: a A A
Keyword [hot-carrier]
Result: 1 - 20 | Page: 1 of 5
1. Degradation Of Thin Film Transistors Under Dynamic Bias Stresses
2. Research Into Reliability Mechanisms And Models For High-voltage SOI-pLDMOS
3. Research Into Reliability Of 550V Lateral IGBT On Thick SOI
4. Study On The Time Dependent Dielectric Breakdown And Reliability Simulation Of Ultra-thin Gate Oxides
5. Study Of Hot-carrier Degradation Effects Of MOSFET
6. The Study On The Hot-Carrier Effect In Deep Sub-Micron MOSFET
7. Study On The Modeling And Hot Carrier Induced Reliability Of Ultra-deep Submicrometer LDD MOSFETs
8. Study On High Electric Field Reliability Of 90nm CMOS Device
9. Study On Hot-Carrier-Induced Reliability Priblems And Lifetime Prediction Method In PMOSFET's
10. Research On Applocation Of 1/f Noise In Detecting Latent Damage In MOS Devices
11. Study On The Structure And Reliability Of Deep Submicrion SDE MOSFET
12. Degradation Behaviors Of Metal Induced Lateral Crystallized N-type Polysilicon Thin Film Transistors Under DC Bias Stresses
13. Research On MOSFET Noise And Hot Carrier Effect
14. An Investigation On Leakage Current Characters And Mechanisms Of Metal-induced Laterally Crystallized N-type Polysilicon Thin Film Transistors Under Hot Carrier Stress
15. Hydrogenation Effects On The Hot-Carrier Degradation Of MILC N-Type Poly-Si TFTs
16. Degradation Research Of Metal Induced Lateral Crystallized N-Type Polysilicon Thin Film Transistors Under DC And AC Bias Stresses
17. Study On Hot-carrier Effect In Ultra-deep Submicronmeter MOSFET
18. Study And Simulation On Reliability Of Poly-Si Thin Film Transistor
19. Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
20. Research On Hot-carrier Effects For Deep-submicron LDD MOSFET
  <<First  <Prev  Next>  Last>>  Jump to