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Keyword [hot-carrier]
Result: 1 - 20 | Page: 1 of 5
1.
Degradation Of Thin Film Transistors Under Dynamic Bias Stresses
2.
Research Into Reliability Mechanisms And Models For High-voltage SOI-pLDMOS
3.
Research Into Reliability Of 550V Lateral IGBT On Thick SOI
4.
Study On The Time Dependent Dielectric Breakdown And Reliability Simulation Of Ultra-thin Gate Oxides
5.
Study Of Hot-carrier Degradation Effects Of MOSFET
6.
The Study On The Hot-Carrier Effect In Deep Sub-Micron MOSFET
7.
Study On The Modeling And Hot Carrier Induced Reliability Of Ultra-deep Submicrometer LDD MOSFETs
8.
Study On High Electric Field Reliability Of 90nm CMOS Device
9.
Study On Hot-Carrier-Induced Reliability Priblems And Lifetime Prediction Method In PMOSFET's
10.
Research On Applocation Of 1/f Noise In Detecting Latent Damage In MOS Devices
11.
Study On The Structure And Reliability Of Deep Submicrion SDE MOSFET
12.
Degradation Behaviors Of Metal Induced Lateral Crystallized N-type Polysilicon Thin Film Transistors Under DC Bias Stresses
13.
Research On MOSFET Noise And Hot Carrier Effect
14.
An Investigation On Leakage Current Characters And Mechanisms Of Metal-induced Laterally Crystallized N-type Polysilicon Thin Film Transistors Under Hot Carrier Stress
15.
Hydrogenation Effects On The Hot-Carrier Degradation Of MILC N-Type Poly-Si TFTs
16.
Degradation Research Of Metal Induced Lateral Crystallized N-Type Polysilicon Thin Film Transistors Under DC And AC Bias Stresses
17.
Study On Hot-carrier Effect In Ultra-deep Submicronmeter MOSFET
18.
Study And Simulation On Reliability Of Poly-Si Thin Film Transistor
19.
Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
20.
Research On Hot-carrier Effects For Deep-submicron LDD MOSFET
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