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1.
Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
2.
Reliability Of Four-Terminal Polycrystalline-Silicon Thin-Film Transistors With A Carrier Injection Terminal
3.
Degradation And Recovery Mechanisims Of Low Temperature Poly-Si Thin Film Transistors Under Static Voltage Stress
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