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Keyword [gate oxide reliability]
Result: 1 - 8 | Page: 1 of 1
1.
.0.25 Micron Cmos Process, Multi-level Gate Oxide Integrity
2.
Double Lattice Oxygen Oxidation Wet Etching And Cleaning Process Before Effect The Performance Of The Thin Oxide Layer Cmos Devices And Its Optimization
3.
Study On The Trap Characteristics And Gate Oxide Reliability Of 4H-SiC MOS Structure
4.
Process development, characterization, transient relaxation, and reliability study of hafnium oxide and hafnium silicate gate oxide for 45nm technology and beyond
5.
Stress tests of analog CMOS ICs for gate-oxide reliability enhancement
6.
Design And Manufacture Of High Voltage Field Controlled Silicon Carbide Power Transistor
7.
Research On Ruggedness And Reliability Of Silicon Carbide MOSFET
8.
Study On Novel Structures For 1.2kV SiC MOSFETs
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