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Result: 1 - 20 | Page: 1 of 2
1.
The Design For Testability And The Circuit Of DSPC50
2.
Research On DFT Methodology Based On STN LCD Driver And Controller
3.
Studies On Extended Compatibilities Scan Tree Construction Based On Weighted Compatible Cliques
4.
Studies On Low Test Response Data Volume For Extended Compatibilities Scan Tree Construction
5.
A Response Compactor Based On Extended Compatibilities Scan Tree Construction
6.
DCScan: A Power-Aware Scan Testing Architecture
7.
Dynamic Extended Compatibilities Scan Tree
8.
Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
9.
Research On Low-cost Test Methods Based On CircularScan Structure
10.
The Research Of Test Generation Methods Based On Controlled Linear Shifter
11.
Studies On Tree Vector Decompressor To Reduce Test Data Volume
12.
Extended Compatibilities For Multiple Scan Tree Construction Of Digital Circuits Test
13.
Based On "dragon R2 Microprocessor Test Structure Design And Research
14.
Studies On Test Cost Reductions Using Scan Chain Disabling Technique
15.
Design-for-Testability Research And Optimization Of TCAM-like Data Network Search Coprocessor
16.
A Test Method Study On Single Chain Full Scan Structure Based On IEEE P1687 Network
17.
Research On Test Data Coding Compression Technology Of VLSI
18.
Research On Test Data Compression Methods In SOC Based On Full Scan Design
19.
Studies On Test Compression Methods Based On Equal Runlength FDR Code For Digital Circuits
20.
Automatic test pattern generator for full scan sequential circuits using limited scan operations
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