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Result: 1 - 8 | Page: 1 of 1
1.
Research On VLSI Low Power BIST Based On Folding Counter
2.
The Research Of Test Data Compression Based On Multiple Scan Chains
3.
The Study On Built-in Self-test (BIST) For Integrated Circuits Based-on Multiple Scan Chains
4.
The Research Of SoC Test Data Compression Based On Coding And Inverted Folding
5.
Test Research Based On RAS Structure
6.
Research On Low Power Deterministic BIST Based On Genetic Algorithm-Folding Counter
7.
The Research On BIST Of Multiple Scan Chains' SoC Based On Folding Counter
8.
System-on-chip BIST Test Generation Technology Research And Application
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