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Keyword [equivalent oxide thickness]
Result: 1 - 4 | Page: 1 of 1
1.
Modeling And Preparation Of High-κ Gate Dielectric Ge-Based MOS Devices
2.
Study On Thermal Stability And Tunneling Current Of Ultrathin Gate Oxidation
3.
Eot Reduction Method For High-k Metal Gate Structure PMOSFETs At 14nm Nodes
4.
Study on high-k dielectrics as alternative gate insulators for 0.1 micron and beyond ULSI applications
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