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Keyword [device degradation]
Result: 1 - 5 | Page: 1 of 1
1.
Study On Hot-Carrier-Induced Reliability Priblems And Lifetime Prediction Method In PMOSFET's
2.
Investigation Of Device Degradation In N-Type Polycrystalline Silicon Thin Film Transistors Under Dynamic Voltage Stresses
3.
Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
4.
Interface Behavior Of Organic Light-Emitting Diode And Its Effects On The Performance Of Devices
5.
Power-saving method for DRAM/eDRAM and 3D-DRAM exploiting the process variations, temperature changes, device degradation, and memory access workload variations and innovative heterogeneous memory management approach using 3D-DRAM with Quality of Service
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