Font Size:
a
A
A
Keyword [bias temperature instability]
Result: 41 - 60 | Page: 3 of 4
41.
Research On Optimized Gate Replacement Technology For Mitigation NBTI-induced Integrated Circuits Aging
42.
NBTI Aging Analysis And Aging-tolerant Design Of Level Shifter
43.
Analysis And Optimization Of The Reliability And Leakage Power Of N-type Domino Gates Circuit
44.
Multi-Constraint To Find The Critical Gates Replacement Technology To Relieve The NBTI Effect
45.
Numerical Simulation Of Pure NBTI Effect And Drain Bias NBTI Effect
46.
Study Of Bias Temperature Instability Based On 65nm Commercial CMOS Process
47.
Research On Relieving The Aging Of Integrated Circuits Caused By NBTI Effect
48.
Research On Online Monitoring System For Reliability Problems In Digital Integrated Circuits
49.
Research On Circuit Reliability Based On Approximate Calculation
50.
Research On Integrated Circuit Aging Mitigation And PCB Defect Detection
51.
Research On The Task Adjustment Algorithm Of Network-on-chip Based On NBTI Aging Effect Perception
52.
Atomic-scale defects involved in the negative bias temperature instability in silicon dioxide and plasma-nitrided oxide based pMOSFETs
53.
Experimental study of bias temperature instability and progressive breakdown of advanced gate dielectrics
54.
Design of negative bias temperature instability (NBTI) tolerant register file
55.
Enhanced hot-hole degradation and negative bias temperature instability (NBTI) in p+-poly PMOSFETs with oxynitride gate dielectrics
56.
Measurements Of Flatband Voltage Shift Characteristics Of SiC MOS Capacitors And Its Control Technology
57.
Electrical Performance And Stability Of High Mobility And Narrow Band-gap Semiconductors Transistors
58.
Electrical Properties And Reliability Studies Of Novel Nanodevices
59.
Research On Temperature-Sensitive Electrical Parameters Of Silicon Carbide MOSFET For Junction Temperature Online Monitoring
60.
Research On SiC MOSFET Junction Temperature Estimation And Bias Temperature Instability
<<First
<Prev
Next>
Last>>
Jump to
