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Keyword [bias temperature instability]
Result: 21 - 40 | Page: 2 of 4
21. Research On Aging Model In High-k Gate Dielectric CMOS Integrated Circuit
22. Research On Aging Of VLSI Induced By NBTI
23. The Research Of NBTI-induced Integrated Circuit Aging Optimization Base On IVC And Gate Replacement Techniques
24. The Research On Test Technology Of Aging For Digital Integrated Circuit
25. Jointly Mitigation Of Multiple Aging Effects In Nanoscale Integrated Circuits
26. Aging Characteristic Analysis And Aging-mitigation Design For Power-Gating Circuit
27. Low Power Design And Aging Resistance Technique For Integrated Circuit Using A Linear Programming Approach
28. Research On Back Gate Modulation Model And Characteristics For Thin Layer SOI High Voltage LDMOS
29. NBTI Aging Analysis And Aging-tolerant Design Of 32nm CMOS Domino Cell Circuits
30. Influence Of Non-uniform Interface Charges On The Threshold Voltage Of PMOS And TFT
31. Design Of Aging Prediction Sensor In Digital Integrated Circuit
32. Modeling NBTI Effect And Its Reliability Design Based On 40nm CMOS Technology
33. Research On NBTI Aging Mitigation Technology Of Integrated Circuit Based On Dual Constraint M-IVC
34. The Researon O Collaborative Mitigation Circuit NBTI-hdced Aging And Leakage Power
35. The Research On Reliability Of Integrated Circuit Induced By NBTI
36. The Research Of NBTI Effect Mechanism And Modeling In Nanometer MOS Devices
37. Research On Mitigating Technology Of IC Aging Caused By NBTI
38. Research On Timing Analysis Of Digital IC With NBTI Effect Considered
39. Research On Aging Fault Protection System In Digital Integrated Circuits
40. Research On The Multi-Vth Configuration Technique For Synergic Mitigation Circuit Aging And Leakage Power
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