bias temperature instability - Globe Thesis

Keyword [bias temperature instability] Result: 1 - 20 \| Page: 1 of 4
1.	Research On Low Cost High Reliability Power Gated SRAM Design
2.	Research On Techniques Of Soft Error Estimation For Nanoscale Integrated Circuits
3.	Study On High Electric Field Reliability Of 90nm CMOS Device
4.	The Statistical Reliability Of The Process Of Integrated Circuits In Nano Analysis And Parallel Optimization Algorithms
5.	0.13um Logic Negative Bias Temperature Instability Improvement
6.	Reliability Characteristics Of SiO_xN_y Gate Dielectrics
7.	Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
8.	Goi And Nbti Reliability Of Deep Submicron Devices
9.	Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
10.	Research On CMOS Insulated Gate Based On DPN Technology
11.	Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
12.	The Mechanism Of Hole Trapping In Negative Bias Temperature Instability
13.	Degradation Mechanisms Of Poly-Si Thin Film Transistors Under Static And Dynamic Voltage Stress
14.	Research On Several Key Issues Of Design For Reliability Of SoC
15.	Quantum Effect And The Influence Of Structure Parameters On The Tunneling Transistor Characteristics
16.	The Research Of VLSI Aging Prediction And Anti-aging Technology
17.	Study For Aging Prediction And ESD Protection Of Integrated Circuits
18.	Research And Implementation Of Profile Mode In The Integrated Circuit Reliability Analysis
19.	Research On Prediction And Tolerance On Integrated-circuits Aging
20.	Research Of Ultra Deep Submicron SoC Embedded Reliability Failure Prediction Technology
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