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Keyword [UIS test]
Result: 1 - 5 | Page: 1 of 1
1.
Research On SiC MOSFET Device Design And Reliability
2.
Test Of Avalanche Tolerance Of High-Voltage Silicon Carbide
3.
Experimental Investigation Of The Single Pulse Avalanche Ruggedness Of SiC Power MOSFET
4.
Research On Performance And UIS Reliability Of SiC MOSFET Integrated Devices
5.
Characteristic Analysis On Short-circuit And UIS Of SiC Power MOSFET Device
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