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Keyword [UIS reliability]
Result: 1 - 4 | Page: 1 of 1
1.
Research Into Degradation Mechanisms And Lifetime Model For SiC VDMOS Under UIS Stress
2.
Investigations On Reliability Of RF-LDMOS Under UIS Stress
3.
Research And Realization Of Shielded Gate Trench Power MOSFET With Low Dissipation And High Reliability
4.
Research On Performance And UIS Reliability Of SiC MOSFET Integrated Devices
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