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Keyword [Trapped charge]
Result: 1 - 5 | Page: 1 of 1
1.
Radiation Effect Mechanism And Reliability In SOI MOSFETs
2.
Research On Ionization-induced Defects Of Gated Lateral Bipolartransistor In Hydrogen Ambient
3.
Low temperature measurement of silicon/silicon dioxide interface roughness and interface trapped charge in metal-oxide-semiconductor devices
4.
Radiation-induced mobility degradation in DMOS transistors
5.
Research On Total Dose Anti-radiation Hardening Technology Based On 45nm FDSOI Device
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