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Keyword [Time-dependent Dielectric Breakdown]
Result: 1 - 8 | Page: 1 of 1
1.
Study On The Time Dependent Dielectric Breakdown And Reliability Simulation Of Ultra-thin Gate Oxides
2.
The Study On The Reliability And Failure Mechanism Of Copper Interconnection In VDSM
3.
High-k Gate Dielectric Reliability
4.
Research On Aging Model In High-k Gate Dielectric CMOS Integrated Circuit
5.
Study Of Time-Dependent Dielectric Breakdown Based On 65nm Commercial CMOS Process
6.
Research On Reliability Evaluation And Design Technology Of Deep Submicron CMOS VLSI
7.
Research On Silicon-based Gold-free Enhancement Gallium Nitride High Electron Mobility Transistor
8.
Research On Process Reliability Evaluation Method And Test Application Of Integrated Circuit Gate Dielectric
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