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Keyword [Test data Volume]
Result: 1 - 5 | Page: 1 of 1
1.
Studies On Extended Compatibilities Scan Tree Construction Based On Weighted Compatible Cliques
2.
Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
3.
Research On Low-cost Test Methods Based On CircularScan Structure
4.
Studies On Tree Vector Decompressor To Reduce Test Data Volume
5.
Reducing test data volume for system-on-chip integrated circuits using test data compression and built-in self-test
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