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Keyword [Test compaction]
Result: 1 - 5 | Page: 1 of 1
1.
Research On Test TEchnology Of VLSI
2.
The Research On Delay Test Algorithm Based On Bounded Delay Model
3.
Research On Compression Method Of Test Data Based On Transformation
4.
Cost reduction and test-quality control for scan-based testing of statistical timing defect
5.
Fast static test compaction and its application to test generation for synchronous sequential circuits
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