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Keyword [Test Set]
Result: 101 - 106 | Page: 6 of 6
101.
A new ATPG algorithm to generate compact test sets which detect static and dynamic defects in VLSI circuits
102.
Optimal test-set generation for analog sampled data systems
103.
Test Set Reordering Method Based On Test Performance Estimation
104.
Research On Defect Diagnosis Based On Test
105.
Research On Optimization Of Fault Test And Diagnosis Of Integrated Circuit
106.
The Study On Adaptive Random Testing Based On Filtering Test Set And Its Application In Numerical Programs
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