Test Data Compression - Globe Thesis

Keyword [Test Data Compression] Result: 41 - 60 \| Page: 3 of 4
41.	Research On Test Data Compression Method Of Optimizing Shift-and Capture-power Simultaneously
42.	Research On Test Data Coding Compression Technology Of VLSI
43.	Studies On Test Data Compression Methods Based On Test Response Filling Technique
44.	Research On Multiple Random Transform Split Test Excitation Compression Method
45.	Research On The Influence Of Don't Care Bits On Decomposing Transform Compression Method
46.	The Research Of Test Data Compression Based On Multiple Scan Chains
47.	Research On Test Data Compression Methods In SOC Based On Full Scan Design
48.	Studies On Test Compression Methods Based On Equal Runlength FDR Code For Digital Circuits
49.	Research On Test Cost Optimization Method Of Three Dimensional Chip Under Power Constraint
50.	Research On The Applications Of Transform Coding In The Test Data Compression
51.	Research On Test Data Compression Schemes For 3D-SoC
52.	Research On Test Data Compression Method Based On Tri-State Signal
53.	Research On Coding Compression Method Based On SOC Test Data
54.	Low-power LFSR Reseeding Test Compression Technology For System On Chip Scan Design
55.	Research On The Principal Component Generation Method In Decomposing Compression Technology
56.	Research On Encoding Compression Method In SoC Test Data
57.	Research On Reconfigurable Testing Schemes For Mid-Bond 3D SoC
58.	Testing for delay defects utilizing test data compression techniques
59.	Reducing test data volume for system-on-chip integrated circuits using test data compression and built-in self-test
60.	Digital core output test data compression architecture based on switching theory concepts: Model implementation and analysis
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