Keyword [Scanning white-light interferometry] Result: 1 - 5 | Page: 1 of 1 1.  A Research On White-light Interferometric Measurement System Of Surface Topography Based On The Scanning Positioning Stage 2.  Denoising Of White Light Interference Signal On The Metal Surface Using Bayesian Estimation 3.  Three-dimensional Denoising Of White Light Interference Signal Using Bayesian Estimation 4.  A Research On Software System Of Vertical Scanning White Light Interferometry Measurement Of Surface Topography 5.  White Light Interference Measurement Signal Processing Based On Generalized Gaussian Distribution And FPGA Implementation   <<First  <Prev  Next>  Last>>  Jump to

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