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Keyword [Scan tree]
Result: 1 - 10 | Page: 1 of 1
1.
Research On Test Compression For Digital IC
2.
Studies On Extended Compatibilities Scan Tree Construction Based On Weighted Compatible Cliques
3.
Studies On Low Test Response Data Volume For Extended Compatibilities Scan Tree Construction
4.
A Response Compactor Based On Extended Compatibilities Scan Tree Construction
5.
Dynamic Extended Compatibilities Scan Tree
6.
Extended Compatibilities For Multiple Scan Tree Construction Of Digital Circuits Test
7.
Studies On Test Compression Efficient Scan Tree Structure Based On FDR Code
8.
Research Of Scan Tree Design For The Reduction Of Test Time And Test Power
9.
Scan Tree Design To Optimaze The Number Of TSVs And Leaf Nodes For 3D-ICs
10.
Studies On Test Compression Methods Based On FDR Code For Digital Circuits
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