Scan chain - Globe Thesis

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Keyword [Scan chain] Result: 1 - 20 \| Page: 1 of 4
1.	New Approaches To Test Compression For Digital Circuits
2.	Research On Low-Power Test In VLSI Scan Test
3.	New Approaches To Soft Error Mitigation For Digital Circuits
4.	Research On Optimization Techniques For SOC Test Time
5.	The Research On Low-Power And Data Compression Techniques In SoC Test
6.	Logic Synthesis And Equivalence Checking Of Communication Chip
7.	A Response Compactor Based On Extended Compatibilities Scan Tree Construction
8.	The Synthesis Implementation And Verification Of Bluetooth Chip
9.	High Performance Low Power Embeded SRAM Design And Optimization
10.	Dynamic Extended Compatibilities Scan Tree
11.	Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
12.	The Research On Optimizing The Test Time On Three-dimensional Integrated Circuits
13.	High-definition Television Atsc-8vsb Chip Test Design
14.	Video Post-processing Chips In The Core Algorithm Implemented In Hardware And Chip Design For Testability
15.	The Pico Dedicated Microcontroller Core Design For Testability
16.	Scan Chain-based Fpga Interconnect Test
17.	Design And Implementation Of A 0.13um FPGA Interconnection Structure
18.	Design And Implementation Of GHz Level Digital Module Test Architecture
19.	Research On Data Compression And Low Power Dissipation Techniques In SoC Test
20.	A Low-Cost Delay Testing Methodology Based On Scan Chain Disabling Technique
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