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Keyword [Scan Design]
Result: 1 - 20 | Page: 1 of 2
1.
Research On DFT Techniques For High-Performance General-Purposed Processors
2.
Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
3.
Research Of Testing Algorithm And BIST Based On Boundary Scan Technology
4.
Studies On Tree Vector Decompressor To Reduce Test Data Volume
5.
SOI PDP Scan Design Of Driving Circuit
6.
Studies On Test Cost Reductions Using Scan Chain Disabling Technique
7.
Design-for-Testability Research And Optimization Of TCAM-like Data Network Search Coprocessor
8.
Research On On-line Detecting Methods Of Faults Reside In Digital Circuits
9.
The Implementation Of DFT For A High-performance Processor
10.
Boundary-scan Design And Implemention For PCIE Based On IEEE1149.6
11.
Research And Implementation Of Hold Timing Optimization Method Based On Reusing Cells In Physical Design
12.
Real-time Spectrum Analyzer System Software Development And Optimization
13.
Research On The Key Techniques Of DFT For Multi-core CPU
14.
Research Of Scan Design Techniques For The Low Test Power Under Area Constraint
15.
Study On Design And Application Of Delay-based Physical Unclonable Function
16.
Research On Spectrum Sharing Strategy In Utility-based Cognitive Radio Networks
17.
Research On The Design Of Integrated Circuit Testability Based On Scan Design
18.
Study On The Design And Application Of Delay-based Physical Unclonable Function Based On The Parallel Scan Chain
19.
Research On Test Data Compression Methods In SOC Based On Full Scan Design
20.
Study On The Technique To Extract PUF Information By Scan Chain And Its Application
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