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Keyword [SRAF]
Result: 1 - 3 | Page: 1 of 1
1.
Study On Preparation And Validation Of Nanometer-Scale OPC
2.
The Application And Optimization Of Sub-Resolution Features In Optical Proximity Correction For 65nm IC Technology And Below
3.
Optimization On Process Windows Of Optical Proximity Correctoin For Advanced Logical Integrated Circuit
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