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Keyword [Ring Oscillator (RO)]
Result: 1 - 4 | Page: 1 of 1
1.
Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
2.
Research And Design Of FPGA-based Low-overhead RO PUF
3.
Research On Improving PUF Reliability Based On FPGA
4.
Research On Reliability Of Physical Unclonable Function Based On FPGA
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