Negative-Bias Temperature Instability - Globe Thesis

Keyword [Negative-Bias Temperature Instability] Result: 1 - 20 \| Page: 1 of 3
1.	Research On Low Cost High Reliability Power Gated SRAM Design
2.	Research On Techniques Of Soft Error Estimation For Nanoscale Integrated Circuits
3.	Study On High Electric Field Reliability Of 90nm CMOS Device
4.	The Statistical Reliability Of The Process Of Integrated Circuits In Nano Analysis And Parallel Optimization Algorithms
5.	0.13um Logic Negative Bias Temperature Instability Improvement
6.	Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
7.	Goi And Nbti Reliability Of Deep Submicron Devices
8.	Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
9.	Research On CMOS Insulated Gate Based On DPN Technology
10.	Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
11.	The Mechanism Of Hole Trapping In Negative Bias Temperature Instability
12.	Degradation Mechanisms Of Poly-Si Thin Film Transistors Under Static And Dynamic Voltage Stress
13.	Research On Several Key Issues Of Design For Reliability Of SoC
14.	The Research Of VLSI Aging Prediction And Anti-aging Technology
15.	Study For Aging Prediction And ESD Protection Of Integrated Circuits
16.	Research On Prediction And Tolerance On Integrated-circuits Aging
17.	Research Of Ultra Deep Submicron SoC Embedded Reliability Failure Prediction Technology
18.	Research On Aging Of VLSI Induced By NBTI
19.	The Research Of NBTI-induced Integrated Circuit Aging Optimization Base On IVC And Gate Replacement Techniques
20.	The Research On Test Technology Of Aging For Digital Integrated Circuit
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