Negative Bias Temperature Instability (NBTI) - Globe Thesis

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Keyword [Negative Bias Temperature Instability (NBTI)] Result: 1 - 11 \| Page: 1 of 1
1.	Research On Low Cost High Reliability Power Gated SRAM Design
2.	0.13um Logic Negative Bias Temperature Instability Improvement
3.	Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
4.	Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
5.	Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
6.	Degradation Mechanisms Of Poly-Si Thin Film Transistors Under Static And Dynamic Voltage Stress
7.	Influence Of Non-uniform Interface Charges On The Threshold Voltage Of PMOS And TFT
8.	Numerical Simulation Of Pure NBTI Effect And Drain Bias NBTI Effect
9.	Research On Circuit Reliability Based On Approximate Calculation
10.	Design of negative bias temperature instability (NBTI) tolerant register file
11.	Enhanced hot-hole degradation and negative bias temperature instability (NBTI) in p+-poly PMOSFETs with oxynitride gate dielectrics
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