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Keyword [Negative Bias]
Result: 1 - 20 | Page: 1 of 3
1. Research On Low Cost High Reliability Power Gated SRAM Design
2. Research On Techniques Of Soft Error Estimation For Nanoscale Integrated Circuits
3. Study On High Electric Field Reliability Of 90nm CMOS Device
4. The Statistical Reliability Of The Process Of Integrated Circuits In Nano Analysis And Parallel Optimization Algorithms
5. Preparation And Characteristic Of Carbon Related Wide Bandgap Semiconductor Materials Prepared By Chemical Vapor Deposition
6. 0.13um Logic Negative Bias Temperature Instability Improvement
7. Degradation Of Metal-Induced Laterally Crystallized P-Type Polycrystalline Silicon Thin Film Transistors Under DC Bias Stress
8. Circuit-level Investigation Of NBTI Effect
9. Goi And Nbti Reliability Of Deep Submicron Devices
10. Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
11. Research On CMOS Insulated Gate Based On DPN Technology
12. Investigation Of Device Degradation In P-channel Ply-Si Thin Film Transistor Under Dynamic Negative Bias Temperature Stress
13. The Mechanism Of Hole Trapping In Negative Bias Temperature Instability
14. Degradation Mechanisms Of Poly-Si Thin Film Transistors Under Static And Dynamic Voltage Stress
15. Design Of Uniaxial Strained Si PMOS And Research On NBTI Effect
16. Research On Several Key Issues Of Design For Reliability Of SoC
17. The Research Of VLSI Aging Prediction And Anti-aging Technology
18. Study For Aging Prediction And ESD Protection Of Integrated Circuits
19. Research On Prediction And Tolerance On Integrated-circuits Aging
20. Research Of Ultra Deep Submicron SoC Embedded Reliability Failure Prediction Technology
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