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Keyword [NO annealing]
Result: 1 - 3 | Page: 1 of 1
1.
The Study On The Design And Key Process Of Advanced 4H-SiC VDMOSFETs
2.
Study On The Trap Characteristics And Gate Oxide Reliability Of 4H-SiC MOS Structure
3.
Research On Reliability Of 4H-SiC Power MOSFETs
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