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Keyword [NBTI]
Result: 61 - 78 | Page: 4 of 4
61.
Study of nanoscale CMOS device and circuit reliability
62.
Atomic-scale defects involved in the negative bias temperature instability in silicon dioxide and plasma-nitrided oxide based pMOSFETs
63.
Experimental study of bias temperature instability and progressive breakdown of advanced gate dielectrics
64.
Reliable and fault tolerant analog and mixed signal circuit design
65.
Design of negative bias temperature instability (NBTI) tolerant register file
66.
Study of oxide breakdown, hot carrier and NBTI effects on MOS device and circuit reliability
67.
Compact Modeling and Simulation for Digital Circuit Aging
68.
On-chip NBTI and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI circuits
69.
Enhanced hot-hole degradation and negative bias temperature instability (NBTI) in p+-poly PMOSFETs with oxynitride gate dielectrics
70.
Leakage-aging tradeoffs in VLSI circuits
71.
Testing, diagnosis and repairing methods for NBTI-induced SRAM faults
72.
Study On The NBTI Effects Of Nanometer PMOSFET
73.
Degradation And Recovery Mechanisims Of Low Temperature Poly-Si Thin Film Transistors Under Static Voltage Stress
74.
Design Of System Aging Monitoring Unit And Voltage Regulation Scheme
75.
Design Of NBTI Effect Aging Monitoring Circuit For SRAM Array
76.
Research And Implementation Of Recycled Chips Detection Based On FCDR?PD Method
77.
Integrated Circuit Aging Monitoring And Its Adaptive Anti-aging Design
78.
Research On Identification And Life Assessment Technology For Integrated Circuits
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