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Keyword [Low-Temperature Polycrystalline Silicon Thin Film Transistor]
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1. Degradation Behaviors Of Metal Induced Lateral Crystallized N-type Polysilicon Thin Film Transistors Under DC Bias Stresses
2. An Investigation On Leakage Current Characters And Mechanisms Of Metal-induced Laterally Crystallized N-type Polysilicon Thin Film Transistors Under Hot Carrier Stress
3. Study On The Properties Of SiO_x/SiN_x Gate Insulator And LTPS-TFT Application
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