Font Size:
a
A
A
Keyword [Interfacial passivation layer Interface-state density]
Result: 1 - 2 | Page: 1 of 1
1.
Interfacial Properties And Oxide Trap Capacitance Effect For GaAs MOS Devices With High-k Gate Dielectric
2.
Optimization Of Material And Processing For Interface Passivation Layer Of Ge MOS Devices With High-k Gate Dielectric
<<First
<Prev Next>
Last>>
Jump to
