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Keyword [IDDT]
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1. Research Of IDDT ATPG Algorithm Based On Ambiguous Delay Assignments And BIST Test Pattern Generator Design
2. Methods For Enhancing The ATPG Efficiency Of Dynamic Current Testing And At-Speed Current Testing Simulation
3. A Method Overcomed The Impact Of Process Parameter In IDDTtesting
4. The Research Of Compression Techniques On Pairs Of Test Vectors Which Were Used In IDDT Testing
5. The Research Of Fault Simulator For IDDT Testing
6. Research On Don't Care Inputs Identifier And Test Generation Algorithm Based On Chaotic Search
7. The Research And Experimental Analysis On Testing Method Of Redundant Faults In Digital Circuits
8. Research On Test Generation Algorithm For Delay Fault And IDDT Test Experiment
9. Research On Transient Current Testing IDDT Technology For Digital Circuit System
10. Research On Testing Technology Based On Current Of Power Supply For Digital Circuit
11. Based On Boolean Process Waveform Space, As Well As Segmented Insertion Sort Algorithm
12. I <sub> Of Ddt </ Sub> Dynamic Current Test Methods,
13. Transient Current Test Generation And Fault Simulation
14. Ic Fault Diagnosis Based On Current Research
15. Current Information In The Ic Fault Diagnosis Applied Research
16. Method Based On The Current Digital Integrated Circuit Failure Diagnosis
17. Dynamic Current-based Ic Testing
18. Iddt Information The Rfics Management Level Fault Modeling And Test Vectors
19. VLSI design of an integrated system for Iddt testing
20. Hardware results demonstrating the effectiveness of defect detection and fault localization using multiple supply pad based IDDT measurements
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