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Keyword [Hot Carrier Injection(HCI)]
Result: 1 - 6 | Page: 1 of 1
1.
The Research Of Hot Carrier Injection Reliability On Deep Submicron N-type High-voltage DDDMOSFET
2.
The Research Of Hot-carrier-effects Reliability And Life Model For NMOS
3.
Stress Degradation Characteristics Of MOS Devices And Ring Oscillator Circuits Based On 65 - Nm Process
4.
Tunneling Field Effect Transistor And Ingaas Field Effect Transistor Reliability Research
5.
Study Of Hot Carrier Injection Effect Based On 0.18um And 65nm Commercial CMOS Technology
6.
Research On Reliability Evaluation And Design Technology Of Deep Submicron CMOS VLSI
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