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Keyword [GaAs MOS devices]
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1. Eelectron-mobility Model And Interfacial Properties Of (In)GaAs MOS Devices With Stacked High-k Gate Dielectric
2. Interface Properties And Structural Simulation Of High-k Gate Dielectric (In)GaAs-based MOS Devices
3. Interfacial Properties And Oxide Trap Capacitance Effect For GaAs MOS Devices With High-k Gate Dielectric
4. Mobility Model And Surface Treatments Of(In)GaAs MOS Devices With High-k Gate Dielectric
5. Threshold Voltage Model And Interfacial Characteristics Of GaAs MOS Devices With High-k Gate Dielectric
6. Improved Interfacial Characteristics Of GaAs MOS Devices By Using NH3-plasma Treated Interfacial Passivation Layer
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