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Keyword [Full scan design]
Result: 1 - 6 | Page: 1 of 1
1.
Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
2.
Studies On Tree Vector Decompressor To Reduce Test Data Volume
3.
Studies On Test Cost Reductions Using Scan Chain Disabling Technique
4.
Design-for-Testability Research And Optimization Of TCAM-like Data Network Search Coprocessor
5.
Research On Test Data Compression Methods In SOC Based On Full Scan Design
6.
DFT Design And Verification Of A Motor Code Disc Control Chip
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