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Keyword [Ellipsometry]
Result: 21 - 36 | Page: 2 of 2
21. Study On Optical Properties Of Deep UV Nitride Materials
22. Study Of Optical Properties And Structures Of MgZnO Alloys
23. Study On Preparation Of Solution-Processed IGZO And IZO Thin Films
24. Effects Of Doping On Physical Properties Of Metal Oxide Semiconductors And Its Application In Thin Film Transistors
25. Spectroscopic ellipsometry analysis on materials for energy efficient applications
26. Discrete retardance-nonlinear optical ellipsometry and polarization analysis of macroscopic assemblies
27. Spectroscopic ellipsometry studies of wide band gap semiconducting materials
28. Design, development, and applications of image scanning ellipsometry for the measurement of thin film thickness profiles
29. Measurement and control of silicon wafer temperature and oxide film thickness in rapid thermal processing using in situ ellipsometry
30. A STUDY OF THE OPTICAL PROPERTIES OF ZIRCALOY 2 AND 4 AND THEIR OXIDES BY ELLIPSOMETRY
31. Studies On The Structural And Photoelectric Properties Of Ga2O3 Thin Films With Ultra-wide Band Gap
32. Study On Photoelectric Properties Of Ion Implanted Polar ZnO Films
33. Optical Properties And Regulatory Mechanisms Of Several Two-Dimensional Transition Metal Dichalcogenides
34. Nondestructive Characterization Method Of Processing Damage Layer On Silicon Carbide Substrate Based On Muller Matrix Ellipsometry
35. Preparation And Characterization Of Two-dimensional VdWs Layered WS2 And BiOI Semiconductors
36. Study On The Influence Of Molecular Orientation And Conjugation Length On Organic Optoelectronic Devices
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