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1.
Study On Rich Indium InGaAs Detecting Material Microphotosensitive Area Characterization Methods
2.
Electron and ion-beam characterization of nitride semiconductor devices
3.
Development and application of electron beam induced current and cathodoluminescence analytical techniques for characterization of gallium nitride-based devices
4.
Electron beam induced conductivity effect of polymer resists and charging induced electron beam deflection simulation in electron beam lithography
5.
Exploring the Electronic Landscape at Interfaces and Junctions in Semiconductor Nanowire Devices with Subsurface Local Probing of Carrier Dynamics
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