Design for Testability - Globe Thesis

Keyword [Design for Testability] Result: 101 - 119 \| Page: 6 of 6
101.	Design For Testability Of YHFT-XX Chip Test Low Power Design And Optimization
102.	Research On Optimization Method Of Testability Design For Electronic System
103.	Study Of Design For Testability Based IP Watermarking Techniques
104.	The Design And Application Of Energy-efficient Flip-flops
105.	Study Of Secure Design-for-testability Technique Based On Cryptographic Hash Function
106.	Verification Of Bidirectional PCI Express Bridge Circuits
107.	Research On Secure Scan Test Architecture Thwarting Scan-Based Side-Channel Attacks
108.	Research And Implementation Of DFT Test Technology For Low Voltage SRAM
109.	Testability Design Of Radiation Hardened SoC
110.	Satisfiability based sequential test generation and design for testability for mixed register-transfer/gate-level circuits
111.	A design for testability scheme for modular and non-modular Quantum Dot Cellular Automata (QCA) employing stuck-at fault model
112.	Design-for-testability techniques for deep submicron technology
113.	Design for testability techniques and optimization algorithms for performance and functional testing of multichip module interconnections
114.	Technology Mapping, Design for Testability, and Circuit Optimizations for NULL Convention Logic Based Architectures
115.	Research On Built-in Test Technology For Communication Equipment
116.	Research And Implementation Of SOC Test Structure Based On IEEE 1687
117.	MEMC Testability Design Based On Samsung11nm Process
118.	Research On Design For Testability Of Display Driver Integrated Circuits
119.	DFT Implementation And Physical Design Based On 28nmDDR PHY
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