Design for Testability - Globe Thesis

Keyword [Design for Testability] Result: 81 - 100 \| Page: 5 of 6
81.	Application Of Folding Counters In SoC Test
82.	Research Of Design For Testability For8bit MCU
83.	The Research On Test Pattern Generator Based On Self-feedback
84.	Research On Low Cost Test Method For RTL Data Path Under Power Constraints
85.	Integrated Circuit Low-power Design-for-testability Analysis And Implementation
86.	The Implementation Of DFT For A High-performance Processor
87.	Study On Fault Diagnosis And Design For Testability Of Analog And Digital Mixed System Based On Boundary Scan
88.	Research Of Scan Chain Inserting And Test Wrapper Installing In IP Core Design For Testability
89.	Research Of Embedded Memory MBIST Based On65nm Process Technology
90.	Research On Test Generation Algorithm For Integrated Circuit And Design For Testability
91.	Research Of Scan Tree Design For The Reduction Of Test Time And Test Power
92.	Research On Optimization Technology Of Diagnostic Strategy Based On Multi-signal Flow Model
93.	Method Of Design For Testability Optimization With Unreliable Test Of Board-level Circuit
94.	Research Of Secure Scan Designs Against Scan-based Side-channel Attacks
95.	SRAM Built-in Self Test Design And Validation Based On March Algorithm
96.	Research And Analysis Of Design For Testability Based On PCIE IP Core
97.	Testability Design Of Programmable Logic Device And Construction Of Verification Platform
98.	The Research On Low Power Test Methods Based On Linear Decompression Structure
99.	Testability Design And Implementation Based On Optimized ATPG (Automatic Test Pattern Generation) Algorithm
100.	A Design For Test Circuit Of Switching Power Controller
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