Delay Test - Globe Thesis

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Keyword [Delay Test] Result: 1 - 18 \| Page: 1 of 1
1.	Instruction-Based Delay Test Generation For Processors
2.	Research On Pattern Grouping And Pattern Selection Methods For Small-Delay Test
3.	The Research On Delay Test Algorithm Based On Bounded Delay Model
4.	Research On Small-delay Test Pattern Generation And The Method Of The Critical Path Selection
5.	Research On Test Path Selection For Combinational Circuit Considering Degradation Effect
6.	The Research On Test Compression And Delay Test For Digital Integrated Circuit
7.	The Research On Delay Test Vector Generation Method
8.	Research On Time-to-digital Converter Technology Based On FPGA
9.	High quality compact delay test generation
10.	Scalable test generation for path delay faults
11.	Timing-oriented approach for delay testing and dynamic timing analysis
12.	Precise timing of digital signals: Circuits and applications
13.	Fault simulation and test generation for small delay faults
14.	Statistical methods for delay test simulation, analysis and optimization
15.	A new delay testing approach based on delay defect detection within slack intervals (DDSI)
16.	Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests
17.	Efficient and high quality delay testing for combinational and scan circuits
18.	VLSI dynamic statistical performance verification and timing/soft error-resilient design
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