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Keyword [Czochralski silicon]
Result: 21 - 40 | Page: 2 of 3
21. Effect Of Vacancy On Nucleation For Oxygen Precipitation In Czochralski Silicon
22. Investigation Of The Property Of N~+-Implanted Czochralski Silicon
23. Investigation Of The Oxygen Relative Defects In Electron Irradiated Czochralski Silicon
24. Study Of Defects In Germanium-doped Czochralski Silicon
25. Internal Gettering And Copper Precipitation In Czochralski Silicon
26. Effects Of Rapid Thermal Annealing On Germanium-doped Czochralski Silicon
27. Nitrogen And Germanium On The Mechanical Properties Of Czochralski Silicon
28. Heavily Boron-doped Silicon Substrate Doped Germanium Growth Of Misfit Dislocations At The P / P ~ + Silicon Epitaxial Wafers
29. Study Of Oxygen-related Defects In Czochralski Silicon
30. Micro Defects In Heavily Phosphorus-doped Czochralski Silicon
31. The Defects In Heavy Boron-doped Czochralski Silicon
32. Effects Of Rapid Thermal Process On Defects In Czochralski Silicon
33. Preferential Etching Of Void Defects In Czochralski Silicon
34. Effect Of Germanium Doping On The Irradiation Hardness Of Czochralski Silicon Material And Device
35. Study Of Electrical Properties Of Czochralski Silicon By Means Of Hall Effect Measurement
36. The Effect Of High Temperature Annealing On Surface Guality And Oxvqen Precipitation Of Polished Czochralski Silicon Wafers
37. Behaviors Of Impurities And Defects In Czochralski Silicon:Effects Of The Heavy Dopinq And Co-dopinq
38. Oxidation Induced Stacking Faults Of Heavily Doped Czochralski Silicon
39. Rapid Thermal Processing-based Internal Gettering For Czochralski Silicon Wafers
40. Effects Of Heavy Doping On The Mechanical Properties Of Czochralski Silicon Wafers
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