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Keyword [Critical charge]
Result: 1 - 5 | Page: 1 of 1
1.
Research Of Soft Error Analysis And Reinforcement Technology In SRAM Under The Effect Of Gate Oxide Degradation
2.
Study On Extraction Technology Of SRAM SEU Effect Parameters Based On SOI CMOS
3.
Study Of Heavy Ion Irradiation Mechanism On SOI FinFET And SEU On SRAM Cell
4.
Modeling and mitigation of soft errors in nanoscale SRAMs
5.
Radiation induced single event transient (SET) effects in bulk and SOI FinFETs and robustness comparison with bulk CMOS
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