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Keyword [C-V test]
Result: 1 - 4 | Page: 1 of 1
1.
A High Frequency C-V Measurement Platform For MOS Capacitors And Threshold Voltage Model For SiGe PMOSFET
2.
Study On Effect Of Annealing Conditions On The Capacitance Characteristics Of MOS 4H-SiC/SiO2
3.
Effect Of Interface Traps On The Mobility And Threshold Stability Of SiC MOS
4.
Preparation And Performance Modification Of HfO_x-based RRAMs On Flexible Subtrates
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