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Keyword [Built-in Test (BIT)]
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1. Research On False-Alarm-Rate Decreasing At Sensor-Level Of Built-in Test Systems In Mechatronic Products
2. Vxi Bus Automatic Test Design And Development Of The Hardware System
3. Ate8000-1 Hardware System Development And Reliability
4. Automatic Failure Mode Based On The Functional Role Model Impact Analysis And Its Implementation
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